FPGAs and Parallel Architectures for Aerospace Applications

Radiation-induced TID effects in Flash-based FPGA have been studied by
research groups [2–9]. ... can be related to known physical mechanisms: charge
loss/gain in floating gate of irradiated Flash cell, which can cause threshold-
voltage shift ... A novel 3D-TCAD simulation generated SEU cross-sections on
fabric FF will be compared with the test data, and its usefulness in the ... Like a
memory cell, it also uses floating-gate NMOS transistor as the basic device to
enable non-volatility.

FPGAs and Parallel Architectures for Aerospace Applications

FPGAs and Parallel Architectures for Aerospace Applications

This book introduces the concepts of soft errors in FPGAs, as well as the motivation for using commercial, off-the-shelf (COTS) FPGAs in mission-critical and remote applications, such as aerospace. The authors describe the effects of radiation in FPGAs, present a large set of soft-error mitigation techniques that can be applied in these circuits, as well as methods for qualifying these circuits under radiation. Coverage includes radiation effects in FPGAs, fault-tolerant techniques for FPGAs, use of COTS FPGAs in aerospace applications, experimental data of FPGAs under radiation, FPGA embedded processors under radiation and fault injection in FPGAs. Since dedicated parallel processing architectures such as GPUs have become more desirable in aerospace applications due to high computational power, GPU analysis under radiation is also discussed.

More Books:

FPGAs and Parallel Architectures for Aerospace Applications
Language: en
Pages: 325
Authors: Fernanda Kastensmidt, Paolo Rech
Categories: Technology & Engineering
Type: BOOK - Published: 2015-12-07 - Publisher: Springer

This book introduces the concepts of soft errors in FPGAs, as well as the motivation for using commercial, off-the-shelf (COTS) FPGAs in mission-critical and remote applications, such as aerospace. The authors describe the effects of radiation in FPGAs, present a large set of soft-error mitigation techniques that can be applied
Science Abstracts
Language: en
Pages:
Authors: Fernanda Kastensmidt, Paolo Rech
Categories: Electrical engineering
Type: BOOK - Published: 1997 - Publisher:

Books about Science Abstracts
Index to IEEE Publications
Language: en
Pages:
Authors: Institute of Electrical and Electronics Engineers
Categories: Electric engineering
Type: BOOK - Published: 1987 - Publisher:

Issues for 1973- cover the entire IEEE technical literature.

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